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Cost effective signal generators for ADC BIST
2009 IEEE International Symposium on Circuits and Systems
ADC in SOC usually has no connection to the outside. Built-in self-test is a good way to verify this block's performance. Stringent requirement of stimulus generator is the most important limitation of ADC BIST. Several methods of using stimulus with low linearity to test ADC with high linearity have been reported for standalone production test. These methods can be adapted for ADC BIST to reduce the BIST cost overhead. This paper investigates signal patterns that can be used in low cost BISTdoi:10.1109/iscas.2009.5117673 dblp:conf/iscas/DuanCG09 fatcat:aycibskc35bk3derjq5wxs7ama