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The ± 45° correlation interferometer as a means to measure phase noise of parametric origin
2003
IEEE Transactions on Instrumentation and Measurement
A radiofrequency interferometic detector is combined with the correlation-and-averaging technique in a new scheme for the measurement of the phase noise of a component. The method relies upon the assumption that the phase noise of the component being tested (DUT) exceeds the amplitude noise, which is consistent with the general experience in the field of wireless engineering. The new scheme is based on the amplification of the DUT noise sidebands and on the simultaneous measurement of the
doi:10.1109/tim.2003.809472
fatcat:2yrpmycprzar7khaskinlhvtry