3-02-01 半解析的有限要素法により求められたガイド波分散曲線とその非破壊検査への適用(測定技術・非破壊検査)
3-02-01 Guided wave dispersion curves derived with a semi-analytical finite element method and its applications to nondestructive inspection(Measurement techiniques, Nondestructive testing)

Takahiro Hayashi
Proceedings of Symposium on Ultrasonic Electronics  
doi:10.24492/use.28.0_351 fatcat:rx5q5datc5hsrlvwuwfavd4m24