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FORCE-DISTANCE SPECTROSCOPY: A GENERIC METHOD TO DETERMINE THE YOUNG'S MODULUS OF FREESTANDING NANOSTRUCTURES
2006
2006 Solid-State, Actuators, and Microsystems Workshop Technical Digest
unpublished
We report here the determination of Young's modulus of bottom-up synthesized nanowires. AFM force-distance spectroscopy was performed at the mid-point of nanowire bridges fabricated using microfabrication techniques. The deflection per unit force was calculated from the difference in slope of the force distance curve on the nanowire bridge and a non-deformable surface. Young's modulus of the nanowires was subsequently deduced from the solution of the first mode of the Euler-Bernoulli beam
doi:10.31438/trf.hh2006.93
fatcat:o5y7ymsdrjdo5htozcrgeryq5e