FORCE-DISTANCE SPECTROSCOPY: A GENERIC METHOD TO DETERMINE THE YOUNG'S MODULUS OF FREESTANDING NANOSTRUCTURES

Q. Xiong, Q. Xiong, S. Tadigadapa, P. Eklund
2006 2006 Solid-State, Actuators, and Microsystems Workshop Technical Digest   unpublished
We report here the determination of Young's modulus of bottom-up synthesized nanowires. AFM force-distance spectroscopy was performed at the mid-point of nanowire bridges fabricated using microfabrication techniques. The deflection per unit force was calculated from the difference in slope of the force distance curve on the nanowire bridge and a non-deformable surface. Young's modulus of the nanowires was subsequently deduced from the solution of the first mode of the Euler-Bernoulli beam
more » ... ernoulli beam equation with fixed-fixed boundary condition and a concentrated point load at the mid-point. The dimensions of the bridge were determined from atomic force microscopy (thickness) and field-emission scanning electron microscopy (length and width). We believe this method provides significant improvements on previously reported methods and can be used in any other nano-beam systems to measure their mechanical properties.
doi:10.31438/trf.hh2006.93 fatcat:o5y7ymsdrjdo5htozcrgeryq5e