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Modification of AFM Tips for Facilitating Picking-up of Nanoparticles
2008
Chinese Physics Letters
The radius of atomic force microscope (AFM) tip is a key factor that influences nonspecific interactions between AFM tip and nanoparticles. Generally, a tip with larger radius contributes to a higher efficiency of picking up nanoparticles. We provide two methods for modifying the AFM tip: one is to wear a tip apex on a solid substrate and the other is to coat a tip with poly (dimethylsiloxane) (PDMS). Both the approaches can enhance the adhesion force between the tip and nanoparticles by
doi:10.1088/0256-307x/25/7/021
fatcat:brrpakqpfnfhjk4ztfgwnvdanm