Modification of AFM Tips for Facilitating Picking-up of Nanoparticles

Wang Peng, Yang Hai-Jun, Wang Hua-Bin, Li Hai, Wang Xin-Yan, Wang Ying, Lü Jun-Hong, Li Bin, Zhang Yi, Hu Jun
2008 Chinese Physics Letters  
The radius of atomic force microscope (AFM) tip is a key factor that influences nonspecific interactions between AFM tip and nanoparticles. Generally, a tip with larger radius contributes to a higher efficiency of picking up nanoparticles. We provide two methods for modifying the AFM tip: one is to wear a tip apex on a solid substrate and the other is to coat a tip with poly (dimethylsiloxane) (PDMS). Both the approaches can enhance the adhesion force between the tip and nanoparticles by
more » ... ing tip radius. The experimental results show that a modified tip, compared to an unmodified one, achieves six-fold efficiency improvement in the capture of targeted colloidal gold nanoparticles.
doi:10.1088/0256-307x/25/7/021 fatcat:brrpakqpfnfhjk4ztfgwnvdanm