The nanoworld through aberration corrected lenses

D J H Cockayne
2010 Journal of Physics, Conference Series  
The nanoworld through aberration corrected lenses To cite this article: D J H Cockayne 2010 J. Phys.: Conf. Ser. 241 012001 View the article online for updates and enhancements. Related content The technique of RDF of nanovolumes using electron diffraction D J H Cockayne, Y Chen, G Li et al. -The realization of atomic resolution with the electron microscope David J Smith -Quantitative techniques for aberration corrected HAADF STEM of nano-materials H E, P D Nellist, A J D'Alfonso et al. -This
more » ... ntent was downloaded from IP address 207.241.231.81 on 25/07 Abstract The advent of aberration correction for electron microscope lenses has produced a significant advance in the improvement of resolution in microscopy. This improvement, while significant in itself, promises to have its most profound impact in materials science when it delivers quantitative information to challenge models and modellers. This capability for an electron microscope-modelling synergy to deliver useful results at the atomic level is not yet firmly established. For this reason, one of the major challenges for electron microscopy in materials science over this decade is to study systems where electron microscopists and modellers can work collaboratively. This paper explores some examples.
doi:10.1088/1742-6596/241/1/012001 fatcat:wb4bdeamjvhitg66vxx6eg7v7y