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Analyzing Radiation-induced Transient Errors on SRAM-based FPGAs by Propagation of Broadening Effect
2019
IEEE Access
SRAM-based field programmable gate arrays (FPGAs) are widely used in mission-critical applications, such as aerospace and avionics. Due to the increasing working frequency and technology scaling of ultra-nanometer technology, single event transients (SETs) are becoming a major source of errors for these devices. In this paper, we propose a workflow for evaluating the behavior of SETs in SRAMbased FPGAs. The method is able to compute the propagation-induced pulse broadening (PIPB) effect
doi:10.1109/access.2019.2915136
fatcat:44gmcxavtzhszceo7u75fri2bm