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Segmentation of thin structures in electron micrographs using orientation fields
2007
Journal of Structural Biology
In this paper, we introduce a new approach for segmenting thin structures in electron micrographs. We introduce two new transforms, the Line Filter Transform (LFT) and the Orientation Filter Transform (OFT). The LFT can be viewed as an alternative to anisotropic diffusion algorithms that is particularly useful for thin structures. The OFT utilizes geometrical information about the structure by measuring correlations of local orientations in the image. By combining these methods with a contour
doi:10.1016/j.jsb.2006.09.007
pmid:17116405
fatcat:ntrx4d7gwjc6blzg45sdrcl4fa