A Modular Memory BIST for Optimized Memory Repair

Philipp Oehler, Alberto Bosio, Giorgio di Natale, Sybille Hellebrand
2008 2008 14th IEEE International On-Line Testing Symposium  
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Most of the existing built-in self-repair solutions reuse IP-Cores for BIST without modifications. However, this prevents an optimized test and repair interaction. In this paper, the concept of modular BIST for memories is introduced, which supports a more efficient interleaving of test and repair and can be achieved with only small modifications in the BIST control.
doi:10.1109/iolts.2008.30 dblp:conf/iolts/OhlerBNH08 fatcat:fn3p3jzxtrh27mn42xmai2uuey