The Minimal Failure-Causing Schema of Combinatorial Testing

Changhai Nie, Hareton Leung
2011 ACM Transactions on Software Engineering and Methodology  
To describe characteristics of failure test cases in the input-domain testing, we propose a model of probabilistic failure-causing schema. In this model, test case that contains a probabilistic failure-causing schema has a probability to be a failure test case. It may help testers to find out input characteristics that have more close relationship to the fault.
doi:10.1145/2000799.2000801 fatcat:yahqumjyebbwrmggwate5fklle