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Effect of electrical and thermal stressing on charge traps in XLPE cable insulation
2012
IEEE transactions on dielectrics and electrical insulation
Insulation peelings were taken from a single 90 kV ac transmission cable whose segments had been stressed for between 8000 and 10 000 h either at elevated temperature (363 K) or field 19.5 kV/mm (rms) (T= 293 K). Control peelings were taken from a cable segment that had experienced no stressing. The various peelings were subjected to an endurance test at 70 kV/mm (rms) and T = 363 K, which demonstrated that only those peelings that had experienced thermal stressing had a reduced lifetime
doi:10.1109/tdei.2012.6396975
fatcat:ayhi4pb24fdtdoqismuctmdisq