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Optimizing bandwidth by compression and compaction always has to solve the trade-off between input bandwidth reduction and output bandwidth reduction. Recently it has been shown that splitting scan chains into shorter segments and compacting the shift data outputs into a single parity bit reduces the test response data to one bit per cycle without affecting fault coverage and diagnostic resolution if the compactor's structure is included into the ATPG process. This test data reduction at thedoi:10.1109/ets.2009.22 dblp:conf/ets/KochteHEW09 fatcat:7nmqbrvgxzelhflueznzq65jii