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High-resolution lenses for sub-100 nm x-ray fluorescence microscopy
2000
Applied Physics Letters
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We report on the design, fabrication, and testing of Fresnel zone plates for high-resolution x-ray fluorescence microscopy using the scanning x-ray microscope at the European Synchrotron Radiation Source. The germanium lenses were optimized for operation near the sulphur absorption edge at 2472 eV photon energy. The high measured diffraction efficiencies of up to 9.6% and the good match to the spatial coherence of the undulator beam resulted in a photon flux of about 4 ϫ10 8 photons per second
doi:10.1063/1.1329638
fatcat:vxtnph3h2zb2xm2hwyqa7q2r3u