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Proceedings. 42nd Design Automation Conference, 2005.
A design for test (DFT) hardware is proposed to increase the controllability of a thermometer coded current steering digital to analog converter. A procedure is introduced to reduce the diagnosis and structural test time from quadratic to linear using the proposed DFT hardware. To evaluate the applicability of the proposed technique, principal component analysis is used to create virtual process variations to simulate in lieu of semiconductor fabrication data. An architecture specific softdoi:10.1109/dac.2005.193934 fatcat:cdd3tclwvfdchik2axrabpjrmu