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Mitigating Wafer Edge Cut Defect through Tensionless Tape Lamination Technique
2020
Journal of Engineering Research and Reports
Thinner and smaller packages require thinner vertical structure of the integrated circuit (IC) design with the wafer playing essential role in package thinning. As the wafer goes thinner, problems may occur in the pre-assembly or wafer preparation. With the introduction of new pre-assembly technology such as laser die attach film (DAF) cut and dicing before grinding, technical challenges were expected. The paper focused on eliminating the edge cutting issue by considering the appropriate taping
doi:10.9734/jerr/2020/v13i317103
fatcat:xwpq3xusljcm7jn2spwenxajba