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Epitaxial (Ba 0.5 Sr 0.5 ) TiO 3 thin films of two different thickness (∼25 and ∼134 nm) on MgO(001) prepared by a pulsed laser deposition method were studied by synchrotron x-ray scattering measurements. The film grew initially with a cube-on-cube relationship, maintaining it during further growth. As the film grew, the surface of the film became significantly rougher, but the interface between the film and the substrate did not. In the early stage of growth, the film was highly strained in adoi:10.1557/jmr.1999.0388 fatcat:vjg6su6zwnb2raqz25avxrm7ze