Image enhancement of x-ray microscope using frequency spectrum analysis

Wenjie Li, Jie Chen, Yijin Liu, Jinping Tian, Xiaobo Zhang, Gang Liu, Ziyu Wu, Yangchao Tian
2009 Journal of Physics, Conference Series  
We demonstrate a new method for x-ray microscope image enhancement using frequency spectrum analysis. Fine sample characteristics are well enhanced with homogeneous visibility and better contrast from single image. This method is easy to implement and really helps to improve the quality of image taken by our imaging system.
doi:10.1088/1742-6596/186/1/012009 fatcat:2sfginlurfhojbcbenhajz73be