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As technology scaling reaches nanometre scales, the error rate due to variations in temperature and voltage, single event effects and component degradation increases, making components less reliable. In order to ensure a system continues to function correctly while facing known reliability issues, it is imperative that the system should have the means to detect the occurrence of errors due to the presence of faults. A system that behaves normally (no error detected in the system) exhibits adoi:10.1109/ivsw.2017.8031548 dblp:conf/ivsw/LengZH17 fatcat:xadhlfsr2vcdrbegwlcz5rtlzy