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Today's VLSI circuits are very compact and complex designs. As the advancements made are very fast with cut throat competitions from various manufacturers, they are likely to have more defects and faults. This requires a proper testing process to be adopted for all products. Testing is a process which has to be done on all pieces of products. At the same time it requires a low cost, highly efficient method to be adopted. Fault coverage should also be maximized for ensuring fast and efficientdoi:10.6084/m9.figshare.1518539.v1 fatcat:ihr5zt5m6nb37g35iga7s6tly4