A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2017; you can also visit the original URL.
The file type is application/pdf.
Sungbae Hwang, Jacob A. Abraham. "Selective-run built-in self-test using an embedded processor." Proceedings of the 12th ACM Great Lakes Symposium on VLSI - GLSVLSI '02 (2002)