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Proceedings of the conference on Design, automation and test in Europe - DATE '08
Low-Cost test methodologies for Systems-on-Chip are increasingly popular. They dictate which features have to be included on-chip and which test procedures have to be adopted in order to guarantee high test quality, while minimizing application costs. Consequently, Low-Cost test strategies can be run on testers offering lower performance and/or reduced features with respect to traditional Automatic Test Equipments (ATEs); these equipments are usually referred to as Low-Cost testers. This paperdoi:10.1145/1403375.1403423 fatcat:62cw22krsrf4nirzbbb7lfqqqe