Analysis of periodic dislocation networks using x-ray diffraction and extended finite element modeling

E. Wintersberger, N. Hrauda, D. Kriegner, M. Keplinger, G. Springholz, J. Stangl, G. Bauer, J. Oswald, T. Belytschko, C. Deiter, F. Bertram, O. H. Seeck
2010 Applied Physics Letters  
We combine the extended finite element method with simulations of diffracted x-ray intensities to investigate the diffusely scattered intensity due to dislocations. As a model system a thin PbSe epitaxial layer grown on top of a PbTe buffer on a CdTe substrate was chosen. The PbSe film shows a periodic dislocation network where the dislocations run along the orthogonal ͗110͘ directions. The array of dislocations within this layer can be described by a short range order model with a narrow
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doi:10.1063/1.3379298 fatcat:eytzphye4zemfaibl6ekxpcf7u