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Electronic Speckle Pattern Interferometry (ESPI) provides a sensitive technique for measuring surface deformations. The technique involves comparison of the speckle phase angles within surface images measured before and after material deformation. This phase angle comparison requires that the speckle positions be consistent in all images. A lateral shift between images by just one pixel substantially degrades ESPI measurements, while a shift of two or more pixels typically causes completedoi:10.14288/1.0071157 fatcat:tzbzwflfgfdb7aft32tmmb55ou