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Characterization of X-ray irradiated graphene oxide coatings using X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy
2013
Powder Diffraction
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In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray Diffraction (XRD), X-ray Photoelectron Spectroscopy (XPS), and Atomic Force Microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive.
doi:10.1017/s0885715613000109
fatcat:vz4trso7encmdkhsbz55mki44e