Characterization of X-ray irradiated graphene oxide coatings using X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy

Thomas N. Blanton, Debasis Majumdar
2013 Powder Diffraction  
In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray Diffraction (XRD), X-ray Photoelectron Spectroscopy (XPS), and Atomic Force Microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive.
doi:10.1017/s0885715613000109 fatcat:vz4trso7encmdkhsbz55mki44e