Recent Developments in Quantitative Electron Tomography

P Midgley, Z Saghi, J Hindson, R Leary, D Holland, A Sederman, L Gladden, V Schmidt, N Greenham
2011 Microscopy and Microanalysis  
Electron tomography has matured over the past decade to become a technique used in both the life sciences and materials science almost on a routine basis. In materials science, the ability of most samples to withstand relatively large electron doses has seen the development of many tomographic imaging modes. The ubiquitous nature of bright-field imaging has led to its use in electron tomography across many fields of materials science, but especially in the study of soft matter where dynamical
more » ... r where dynamical effects and diffraction contrast is often minimal [1] . For many materials however, STEM HAADF tomography remains the mode of choice, yielding high contrast images which are relatively free of crystallographic artefacts [2] . A combination of STEM tomography and EELS has seen the first examples of 3D chemical mapping [3] and, similarly, EFTEM tomography can produce volume-specific compositional information [4] . Defects and secondary phases can be mapped using diffraction contrast tomography, if the diffraction conditions do not change significantly across the tilt series [5] . Recent work has shown that time-resolved electron tomography is possible, with femtosecond pulsing of nanostructures showing vibrational characteristics in 3D [6] . With all these modes, however, there remains a pressing need to extract reliable, quantitative information from 3D reconstructions. This information can be subject to many sources of error, at image acquisition, during the reconstruction process, through to segmentation, visualization and during additional tomogram processing. In order to be more confident in the information garnered from tomograms we need methods to improve the fidelity of the reconstruction (e.g. minimizing missing wedge artefacts) and more automated and objective ways to best process the tomograms to recover key information. 932
doi:10.1017/s1431927611005538 fatcat:ma5jqnczebeuzoviyucb3gmsbu