Many industrial experiments have shown that the very simple and time-efficient Scan test detects many unique faults. This paper shines a new light on the properties of Scan test; such properties will be evaluated using industrial data. In addition, it will be shown that many faults in a memory, which are not in the cell array, are detectable using the appropriate read-write sequences. The traditional version of Scan test performs 'some' of such read-write sequences, but lacks the capability of

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... erforming all of them for both the 'up' and the 'down' address orders and the '0' and the '1' data values. Therefore a new set of Scan based tests will be proposed to fill that vacuum.