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In modern high-resolution transmission electron microscopy lens aberrations, in particular the strong third-order spherical aberration of the objective lens, severely limit the conditions for a directly interpretable imaging of object structures. In recent years hardware aberration correction  and software aberration correction of reconstructed exit wave functions [2, 3] have become feasible, thus fully exploiting the information limit of an instrument. Both methods require an accuratedoi:10.1017/s1431927604883922 fatcat:4mgiic66nnfufa6mbmo7k6i7xi