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Process induced variations in the interconnect capacitance and resistance have resulted in significant uncertainly in the interconnect delay. In this work, we propose a new method to compute the interconnect corner considering coupling-noise due to simultaneous switching of aggressors. In prior approaches, the interconnect corners were computed under the assumption that the aggressor nets are not switching and no coupling-noise is injected on the victim net. In this paper, we first show thatdoi:10.1109/iccd.2009.5413148 dblp:conf/iccd/GandikotaBS09 fatcat:4kpns37xjfaitnp3a3iarn36du