Defect severity estimation often shows promise in the laboratory; however, due to multiple factors which affect defect force, masking vibration, and transfer path dynamics, defect severity estimation in deployed systems can be very fragile. Current defect severity estimation techniques rely on defect feature amplitude, which is often more dependent on factors other than the actual defect size. The authors have developed a mechanical waveguide which provides a stable vibration transfer path and

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... voids masking vibration noise. This enables direct defect force measurement by deconvolution of the transfer path dynamics, providing a "digital" defect size measurement.