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Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique
2017
2017 Symposium on VLSI Technology
unpublished
A novel BSC circuit with tunable current starved buffers demonstrates higher sensitivity, scalability & accurate statistical characterization of radiation-induced SET pulse waveforms & flipflop SER in 14nm tri-gate CMOS, thus enabling improved SER estimation & analysis for a range of supply voltages including NTV.
doi:10.23919/vlsit.2017.7998134
fatcat:p7gh6ksst5dklf4yarjgct2rk4