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Characterizing the free and surface-coupled vibrations of heated-tip atomic force microscope cantilevers
2014
Nanotechnology
Combining heated-tip atomic force microscopy (HT-AFM) with quantitative methods for determining surface mechanical properties, such as contact resonance force microscopy, creates an avenue for nanoscale thermomechanical property characterization. For nanomechanical methods that employ an atomic force microscope cantilever's vibrational modes, it is essential to understand how the vibrations of the U-shaped HT-AFM cantilever differ from those of a more traditional rectangular lever, for which
doi:10.1088/0957-4484/25/34/345701
pmid:25098183
fatcat:fu2y7mz7ffeybgl7l3frujwe7m