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Comparison of One and Two Stage RF Rectifiers Designed in FDSOI 28 nm and BiCMOS 55 nm
2019
2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
The context of this article is a low power application: RF energy harvesting. In this paper, we compare performances of two Dickson voltage rectifiers realized with two different technologies: FDSOI 28 nm and BiCMOS 55 nm. The measurement of I-V characteristics of diodes in both technologies reveals that FDSOI shows a smaller threshold voltage and less leakage current compared to BiCMOS. It is also ascertained through the measurement results that the efficiency of the rectifier realized with
doi:10.1109/eurosoi-ulis45800.2019.9041872
fatcat:2sbroix25jfulmmu3v62fk7csu