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One of the next challenges for asynchronous communication architectures is reliability, in the form of robustness to single event effects, when under the impact of particles generated by ionizing radiation. This occurs because technology downscaling continuously increases the logic sensitivity of silicon devices to such effects. Contrary to what happens in synchronous circuits, delay variations induced by radiation usually have no impact on asynchronous quasi-delay insensitive combinationaldoi:10.1109/sbcci.2013.6644865 dblp:conf/sbcci/PontesCV13 fatcat:uo7lmf3jsvedpcvsdxyvjeioou