One of the next challenges for asynchronous communication architectures is reliability, in the form of robustness to single event effects, when under the impact of particles generated by ionizing radiation. This occurs because technology downscaling continuously increases the logic sensitivity of silicon devices to such effects. Contrary to what happens in synchronous circuits, delay variations induced by radiation usually have no impact on asynchronous quasi-delay insensitive combinational

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... c blocks, but in storage devices, bit flips may corrupt the circuit state with no recovery solution, even when using asynchronous circuits. This work proposes a new set of hardening techniques against single event effects applicable to asynchronous networks-on-chip. It presents practical case studies of use for these techniques and evaluates them in close to real life situations. Obtained results show that the achieved increase in asynchronous network-on-chip robustness has the potential to leverage this communication architecture solution as the main choice for the next generations of complex silicon devices on advanced nodes technologies such as 32 nm, 28 nm and below. Keywords-asynchronous circuits; networks on chip; soft error; single event effect I.