NASA B-757 HIRF test series low power on-the-ground tests

A.J. Poggio, R.A. Zacharias, S.T. Pennock, C.A. Avalle, H. Carney
1996 IEEE Aerospace and Electronic Systems Magazine  
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doi:10.1109/62.490221 fatcat:wpdc45ixcfbznnvxcs6tyyyf5i