TFT-LCD Defect Detection based on Histogram Distribution Modeling
히스토그램 분포 모델링 기반 TFT-LCD 결함 검출

2015 Journal of Korea Multimedia Society  
TFT-LCD automatic defect inspection system for detecting defects in place of the visual tester does pre-processing, candidate defect pixel detection, and recognition and classification through a blob analysis. An over-detection result of defects acts as an undue burden of blob analysis for recognition and classification. In this paper, we propose defect detection method based on the histogram distribution modeling of TFT-LCD image to minimize over-detection of candidate defective pixels.
more » ... defect candidate pixels are detected estimating the skewness of the luminance distribution histogram of the background pixels. Based on the detected defect pixels, the defective pixels other than noise pixels are detected using the distribution histogram model of the local area. Experimental results confirm that the proposed method shows an excellent defect detection result on the image containing the various types of defects and the reduction of the degree of over-detection as well.
doi:10.9717/kmms.2015.18.12.1519 fatcat:7yaqzktoq5fqpd6zkoelrepyqq