Size Measurement of Nanoparticle Assembly Using Multilevel Segmented TEM Images

Paisarn Muneesawang, Chitnarong Sirisathitkul
2015 Journal of Nanomaterials  
Multilevel image segmentation is demonstrated as a rapid and accurate method of quantitative analysis for nanoparticle assembly in TEM images. The procedure incorporatingK-means clustering algorithm and watershed transform is tested on transmission electron microscope (TEM) images of FePt-based nanoparticles whose diameters are less than 5 nm. By solving the nanoparticle segmentation and separation problems, this unsupervised method is useful not only in the nonoverlapping case but also for
more » ... se but also for agglomerated nanoparticles. Furthermore, the method exhibits scale invariance based on comparable results from images of different magnifications.
doi:10.1155/2015/790508 fatcat:d2fizzrbjbf35pid5h4pezcssq