A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2018; you can also visit the original URL.
The file type is application/pdf
.
Measurement of semiconductor surface potential using the scanning electron microscope
2012
Journal of Applied Physics
Transducer for mechanical impedance testing over a wide frequency range through active feedback Rev. Sci. Instrum. 83, 025001 (2012) Performance of a fast digital integrator in on-field magnetic measurements for particle accelerators Rev. Sci. Instrum. 83, 024702 (2012) Generalized four-point characterization method using capacitive and ohmic contacts Rev. Sci. Instrum. 83, 024703 (2012) Extracting accurate capacitance voltage curves from impedance spectroscopy Appl. Phys. Lett. 100, 042101
doi:10.1063/1.3684556
fatcat:6cvt4vcuijc4tply5o3da2e7ee