A Microelectromechanical System for Nano-Scale Testing of One Dimensional Nanostructures

B. Peng, Y. Zhu, I. Petrov, H. D. Espinosa
2008 Sensor Letters  
In situ electron microscopy tensile tests of nanowires and carbon nanotubes performed using a MEMS-based material testing system are reported. The development of the material testing system (previously reported elsewhere 23-26 ) is briefly reviewed. This system, consisting of a surface micromachined actuator and load sensor, makes possible continuous observation of specimen deformation and failure with sub-nanometer resolution, while simultaneously measuring the applied load electronically with
more » ... nanonewton resolution. This letter begins with a brief review of some of the methods used in mechanical characterization of nanoscale specimens, followed by a description of the MEMS-based material testing system. Finally, emphasis is placed on experimental results demonstrating the advantages of the MEMS-based system.
doi:10.1166/sl.2008.015 fatcat:g6gjfzsorrhfday74ovxlpcxve