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The present work incorporates a study on nucleation, and growth due to the changes in the nano-structural properties as a function of thickness and grain boundary reflection in tin thin nanofilms Thickness happens to be one of the important and crucial nanofilm preparative parameters which dictates majority of properties like, nano-structure, electrical, optical and morphological texture of evaporated tin nanofilms. Hence, we have selected tin nanofilms in the thickness range 20-160 nm, indoi:10.1088/1742-6596/1186/1/012006 fatcat:jque4ajsdvd7xp2jo7tjpshoom