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New Possibilities for In-Situ Electrical Characterization Of Nanosamples at Different Temperatures Combined with Simultaneous TEM Observations
2013
Microscopy and Microanalysis
Preserved Fulltext
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
doi:10.1017/s1431927613004273
fatcat:qtgbqwloqvamjho5xpvhzphjq4