Fully depleted, back-illuminated charge-coupled devices fabricated on high-resistivity silicon

S.E. Holland, D.E. Groom, N.P. Palaio, R.J. Stover, Mingzhi Wei
2003 IEEE Transactions on Electron Devices  
Charge-coupled devices (CCD's) have been fabricated on high-resistivity, n-type silicon. The resistivity, on the order of 10,000 Ω-cm, allows for depletion depths of several hundred microns. Fully-depleted, back-illuminated operation is achieved by the application of a bias voltage to a ohmic contact on the wafer back side consisting of a thin in-situ doped polycrystalline silicon layer capped by indium tin oxide and silicon dioxide. This thin contact allows for good short wavelength response,
more » ... hile the relatively large depleted thickness results in good near-infrared response.
doi:10.1109/ted.2002.806476 fatcat:eckmummpgfcyjbiqv7yfykoilq