A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2015; you can also visit the original URL.
The file type is
Negative Bias Temperature Instability (NBTI) is an important lifetime reliability problem in microprocessors. SRAM-based structures within the processor are especially susceptible to NBTI since one of the PMOS devices in the memory cell always has an input of '0'. Previously proposed recovery techniques for SRAM cells aim to balance the degradation of the two PMOS devices by attempting to keep their inputs at a logic '0' exactly 50% of the time. However, one of the devices is always in thedoi:10.1109/isvlsi.2010.15 dblp:conf/isvlsi/SiddiquaG10 fatcat:vr7bysrwdvbnjn7ynputiyw47u