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Interferometry XVII: Techniques and Analysis
Optical 3D profilers based on Coherence Scanning Interferometry (CSI) provide high-resolution non-contact metrology for a broad range of applications. Capture of true color information together with 3D topography enables the detection of defects, blemishes or discolorations that are not as easily identified in topography data alone. Uses for true color 3D imaging include image segmentation, detection of dissimilar materials and edge enhancement. This paper discusses the pros and cons of colordoi:10.1117/12.2063264 fatcat:36ck46gq7beobpmkbnoy3owkc4