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The Influence of Oxygen Pressure on the Photoluminescent Properties of Pulsed Laser Ablated SrAl 2O 4:Eu 2+ , Dy 3+ Thin Films
American Journal of Optics and Photonics
SrAl 2 O 4 :Eu 2+ , Dy 3+ thin films were prepared using the pulsed laser deposition (PLD) technique and the variation of morphological, photoluminescence and structural properties with the oxygen pressure were studied. The atomic force microscopy (AFM) and scanning electron microscopy (SEM) were employed in the films morphological measurements. The He-Cd 325 nm laser photoluminescence (PL) system and xenon lamp Cary Eclipse fluorescence spectrophotometer were used to collect thedoi:10.11648/j.ajop.20160404.11 fatcat:lpizxgenlrhkxmimdk4rwttrum