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Novel Interferometer in the Soft X-Ray Region
1998
Physical Review Letters
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A novel interferometer has been developed with which the complex index of refraction of thin self-supporting foils can be measured in the vacuum ultraviolet and soft x-ray region. It consists of two collinear undulators and a grating spectrometer. Taking advantage of the low emittance 855 MeV electron beam from the Mainz Microtron, distinct intensity oscillations have been observed as a function of the distance between the undulators. A foil placed between the undulators causes a phase shift
doi:10.1103/physrevlett.80.5473
fatcat:g4ovkzf5efglxbmpbglm5avpvm