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中性子転換注入GaNのキャリア補償機構に関する研究
Neutron transmutation doped(NTD)-GaN, which is irradiated with fast and thermal neutrons at fluxes of 6.7 x 10 18 cm -2 and 1.4 x 10 19 cm -2 , respectively, keeps the high resistivity of 10 8 Ωcm at room temperature. The energy level estimated from the temperature dependence of carrier concentration by high temperature alternating current Hall effect measurements is 960 meV. This energy is attributed to the nitrogen interstitial (N i ) as a deep acceptor level located below the bottom of the
doi:10.15002/00011145
fatcat:xhbbivct2vciha3txpvplrevhi