ESD field coupling study in relation with PCB GND and metal chassis

Jong-sung Lee, David Pommerenke, Jae-deok Lim, Byong-su Seol
2009 2009 20th International Zurich Symposium on Electromagnetic Compatibility  
This work demonstrates a simple experimental setup to measure ESD-induced voltage to traces on a printed circuit board when ESD current is injected directly onto the outside of a metal case and presents how the induced voltage can be affected by the physical structure of the PCB ground and the metal case. The correlation between ESD-induced voltage and the method of connecting the PCB and chassis grounds shall be discussed, as well as how the PCB ground fill affects ESD. These experimental
more » ... ts may provide guidance for a better design for ESD immunity.
doi:10.1109/emczur.2009.4783413 fatcat:y7b3ev5ipff37ll7c3hbt6cuka