Dependence of the 1/f Noise Characteristics of CMOSFETs on Body Bias in Sub-threshold and Strong Inversion Regions

Sung-Kyu Kwon, Hyuk-Min Kwon, Ho-Young Kwak, Jae-Hyung Jang, Jong-Kwan Shin, Seon-Man Hwang, Seung-Yong Sung, Ga-Won Lee, Song-Jae Lee, In-Shik Han, Yi-Sun Chung, Jung-Hwan Lee (+1 others)
2013 JSTS Journal of Semiconductor Technology and Science  
In this paper, the 1/f noise characteristics of n-channel MOSFET (NMOSFET) and p-channel MOSFET (PMOSFET) are analyzed in depth as a function of body bias. The normalized drain current noise, S ID /I D 2 showed strong dependence on the body bias in the sub-threshold region for both NMOSFET and PMOSFET, and NMOSFET showed stronger dependence than PMOSFET on the body bias. On the contrary, both of NMOSFET and PMOSFET do not exhibit the dependence of S ID /I D 2 on body bias in strong inversion
more » ... strong inversion region, although the noise mechanisms of two MOSFETs are different from each other.
doi:10.5573/jsts.2013.13.6.655 fatcat:4w2cdxhmrve2xgf6ambfq57y64