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Theoretical Study of Ionization of Polymers for EUV Resist
2012
Journal of Photopolymer Science and Technology (Fotoporima Konwakai shi)
We have investigated the ionization of polymers for extreme ultraviolet (EUV) exposure. Quantum chemical calculation was performed. Upon EUV exposure to the polymer in a resist, the ionization of the polymer occurs and the secondary electrons generate. As the secondary electrons from the polymer cause the reaction of photoacid generator and the photoacid generates, the ionization of the polymer is a key for the sensitivity of resist for EUV. In this paper, the study of polymers was performed.
doi:10.2494/photopolymer.25.101
fatcat:p3zurlhr6nbulg24wzazxpkyiy