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HIGH-TEMPERATURE X-RAY CONDUCTIVITY OF EXTRA PURE ZNSE CRYSTALS
2011
Sensor Electronics and Microsystem Technologies
Àíîòàö³ÿ. Ïðîâåäåí³ åêñïåðèìåíòàëüí³ äîñë³äaeåííÿ òåìïåðàòóðíèõ çàëåaeíîñòåé ðåíò-ãåíîëþì³íåñöåíö³¿, ðåíòãåíî-³ òåìíîâî¿ ïðîâ³äíîñò³ âèñîêîîìíèõ íåëåãîâàíèõ êðèñòàë³â ZnSe. Âñòàíîâëåíî, ùî òåìíîâà ïðîâ³äí³ñòü çðàçê³â ïðè òåìïåðàòóðàõ Ò > 400 Ê îáóìîâëåíà òåðì³÷íîþ äåëîêàë³çàö³ºþ íîñ³¿â ç ãëèáîêèõ ëîêàëüíèõ ð³âí³â Å Ò = 0.83 åÂ, ³ âåëè÷èíà ðåíòãåíîïðîâ³äíîñò³ ïðè íàãð³âàíí³ äî 350 Ê ìîíîòîííî ñïàäàº, àëå ïðè âèùèõ òåìïåðàòóðàõ -íàâ³òü ïîñòóïîâî çðîñòàº. Çàâäÿêè âèÿâëåíèì îñîáëèâîñòÿì
doi:10.18524/1815-7459.2011.4.118607
fatcat:evxjrexqzrdv5ddfkhzjkvxlsa